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Copyright ©1998-2004:
AMKO Systems Inc.
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With the new generation of devices, AMKO offers a broad range of systems for detecting and monitoring dust concentrations. All of the dust analyzers can be seamlessly integrated into existing measurement systems at your plant. They can also be tested easily and at low cost using remote diagnosis. If required, all of the SICK dust concentration monitors can be parametrized with a PC and the user-friendly MEPA software (MEnu-driven PArametrization, with multi-language capability).

Advantages at a glance:

Direct and instant process measurement through non-contact in-situ measuring technique
High measuring reliability
Autocollimator and scattered-light measuring principles
Purge air protects the optical boundary surfaces in pressurized plants
Long maintenance-free operating times, low maintenance requirements
Flexible, user-friendly parametrization via MEPA software